Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7551715 | X-ray inspection based on scatter detection | Peter J. Rothschild, Jeffrey R. Schubert, William J. Baukus, Richard Schueller, Joseph Callerame +1 more | 2009-06-23 |
| 7538325 | Single-pulse-switched multiple energy X-ray source applications | Andrey Mishin, Peter J. Rothschild | 2009-05-26 |
| 6067344 | X-ray ambient level safety system | Lee Grodzins, Suzhou Huang, William Adams | 2000-05-23 |