Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8923481 | Methods to perform backscatter inspection of complex targets in confined spaces | Jeffrey R. Schubert, John P. Handy, Richard Schueller, Terry McElroy, David C. Walazek | 2014-12-30 |
| 7551715 | X-ray inspection based on scatter detection | Peter J. Rothschild, Jeffrey R. Schubert, William Wade Sapp, Jr., Richard Schueller, Joseph Callerame +1 more | 2009-06-23 |
| 7505556 | X-ray backscatter detection imaging modules | Alex Chalmers, Louis W. Perich, Peter J. Rothschild | 2009-03-17 |