Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8356270 | Interconnect and transistor reliability analysis for deep sub-micron designs | Tom Burd, Yuri Apanovich, Vishak Venkatraman, Anand Daga | 2013-01-15 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8356270 | Interconnect and transistor reliability analysis for deep sub-micron designs | Tom Burd, Yuri Apanovich, Vishak Venkatraman, Anand Daga | 2013-01-15 |