Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7032194 | Layout correction algorithms for removing stress and other physical effect induced process deviation | Xiao-Jie Yuan, Daniel Gitlin | 2006-04-18 |
| 6878561 | Mask-alignment detection circuit in X and Y directions | Kevin T. Look | 2005-04-12 |
| 6716653 | Mask alignment structure for IC layers | Kevin T. Look | 2004-04-06 |
| 6684520 | Mask-alignment detection circuit in x and y directions | Kevin T. Look | 2004-02-03 |
| 6569576 | Reticle cover for preventing ESD damage | Kevin T. Look, Jonathan Ho | 2003-05-27 |
| 6563320 | Mask alignment structure for IC layers | Kevin T. Look | 2003-05-13 |
| 6465305 | Methods and circuits employing threshold voltages for mask-alignment detection | Kevin T. Look | 2002-10-15 |
| 6436726 | Methods and circuits for mask-alignment detection | Kevin T. Look | 2002-08-20 |
| 6426534 | Methods and circuits employing threshold voltages for mask-alignment detection | Kevin T. Look | 2002-07-30 |
| 6393714 | Resistor arrays for mask-alignment detection | Kevin T. Look | 2002-05-28 |
| 6305095 | Methods and circuits for mask-alignment detection | Kevin T. Look | 2001-10-23 |