Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11715297 | Utilizing computer vision and machine learning models for determining utilization metrics for a space | Marc Bosch Ruiz, Paul Michael Ott, Vijay Raman | 2023-08-01 |
| 6589860 | System and method for calibrating electron beam defect inspection tool | Boon Yong Ang, Kenneth R. Harris | 2003-07-08 |