Issued Patents All Time
Showing 76–83 of 83 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6606273 | Methods and systems for flash memory tunnel oxide reliability testing | Xin Guo, Zhigang Wang | 2003-08-12 |
| 6596586 | Method of forming low resistance common source line for flash memory devices | Un Soon Kim, Zhigang Wang | 2003-07-22 |
| 6593590 | Test structure apparatus for measuring standby current in flash memory devices | Zhigang Wang, Tien-Chun Yang | 2003-07-15 |
| 6590260 | Memory device having improved programmability | John Jianshi Wang, Zhigang Wang | 2003-07-08 |
| 6570787 | Programming with floating source for low power, low leakage and high density flash memory devices | Zhigang Wang, Xin Guo | 2003-05-27 |
| 6486682 | Determination of dielectric constants of thin dielectric materials in a MOS (metal oxide semiconductor) stack | Zhigang Wang, Tien-Chun Yang | 2002-11-26 |
| 6472236 | Determination of effective oxide thickness of a plurality of dielectric materials in a MOS stack | Zhigang Wang, Tien-Chun Yang | 2002-10-29 |
| 6461905 | Dummy gate process to reduce the Vss resistance of flash products | Zhigang Wang, Hsiao-Han Thio | 2002-10-08 |