Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10120430 | Dynamic reliability quality monitoring | Stephen V. Kosonocky, Thomas D. Burd, Adam Neil Calder Clark, Larry D. Hewitt, John P. Petry | 2018-11-06 |
| 8818785 | Method and apparatus for simulating gate capacitance of a tucked transistor device | Jung-Suk Goo, Ciby Thuruthiyil, Venkat Ramasubramanian | 2014-08-26 |