Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 6970806 | Method and system for testing articles of manufacture | Vinayak Divate, Pichit Saengpongpaew | 2005-11-29 | $10,680,000 |
| 6966016 | System and method for erase test of integrated circuit device having non-homogeneously sized sectors | Janevoot Naksrikram, Aeksit Suraphak | 2005-11-15 | $25,400,000 |
| 6546523 | High speed first pass yield report program and method | Sedta Boorananut, Adunkitt Mankhong | 2003-04-08 | $2,382,000 |