Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 6966016 | System and method for erase test of integrated circuit device having non-homogeneously sized sectors | Janevoot Naksrikram, Jitrayut Junnapart | 2005-11-15 | $25,400,000 |