Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11879942 | Core and interface scan testing architecture and methodology | Shrikrishna Pundoor, Mahesh Rawal, Aviral Agarwal | 2024-01-23 |
| 10234505 | Clock generation for integrated circuit testing | Ismed D. Hartanto, Alex S. Warshofsky, Pranjal Chauhan | 2019-03-19 |
| 10169177 | Non-destructive online testing for safety critical applications | Pranjal Chauhan, Pramod Surathkal, Alex S. Warshofsky, Tomai Knopp, Soumitra Kumar Bhowmick +1 more | 2019-01-01 |
| 10067189 | Input/output path testing and characterization using scan chains | Ahmad R. Ansari, Sanjeeva R. Duggampudi, Pramod Surathkal, Ushasri Merugu, Bommana S. Rao +2 more | 2018-09-04 |