Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7556971 | Testing electromigration at multiple points of a single node | Scott Christopher Peacock, Wynce Lam, Richard Ira Dowell | 2009-07-07 |
| 7257751 | Apparatus and method for random pattern built in self-test | Jeffrey Thomas Robertson, David Mielke | 2007-08-14 |
| 6982575 | Clock ratio data synchronizer | — | 2006-01-03 |
| 6978406 | System and method for testing memory arrays | Jeffrey Thomas Robertson | 2005-12-20 |
| 6918073 | Differential self-test of input/output circuits | David Linam, Christopher Helt | 2005-07-12 |
| 6895061 | Scannable synchronizer having a deceased resolving time | — | 2005-05-17 |
| 6857113 | Process and system for identifying wires at risk of electromigration | Jason T. Gentry, David D. Balhiser, Ronald G Harber, Bryan Haskin, Paul J. Marcoux | 2005-02-15 |
| 6807658 | Systems and methods for performing clock gating checks | David Mielke | 2004-10-19 |
| 6775116 | Method and apparatus for preventing buffers from being damaged by electrical charges collected on lines connected to the buffers | Paul D Nuber | 2004-08-10 |
| 6769101 | Systems and methods providing scan-based delay test generation | — | 2004-07-27 |
| 6760893 | Using transition time checks to determine noise problems on signal lines of an integrated circuit | — | 2004-07-06 |
| 6721931 | System and method for simplifying clock construction and analysis | Kristin Marie Richling, Edgardo Pablo Lopez, Guy Humphrey, Richard A. Krzyzkowski, Laurent Pinot | 2004-04-13 |
| 6188260 | Master-slave flip-flop and method | Dan Stotz, Raymond W Rosenberry, Kent R. Townley | 2001-02-13 |
| 5068881 | Scannable register with delay test capability | Bulent Dervisoglu | 1991-11-26 |