Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7089139 | Method and apparatus for configuration of automated debug of in-circuit tests | Aik Koon Loh, Keen Fung Wai, Tiam Hock Tan, Roy Williams, Daniel Whang +1 more | 2006-08-08 |