Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11175212 | Mid-infrared scanning system for analyzing particulates | Andrew Ghetler, Matthew Kole | 2021-11-16 |
| 11060914 | Calibration system for attenuated total reflection spectrometry | Charles Hoke | 2021-07-13 |
| D893173 | Bandoleer | Joshua Tyler Sprecher | 2020-08-18 |
| 10184835 | High dynamic range infrared imaging spectroscopy | Charles Hoke, Andrew Ghetler, Yang Han | 2019-01-22 |
| 10054611 | Method of controlling frequency modulated-atomic force microscope | — | 2018-08-21 |
| 9924115 | Apparatus and method for three-dimensional infrared imaging of surfaces | — | 2018-03-20 |
| 9863877 | Infrared spectrometer and scanner utilizing attenuated total reflection | Charles Hoke, Andrew Ghetler, Yuri Beregovski, Richard P. Tella, Yang Han | 2018-01-09 |
| 9689891 | Automatic gain tuning in atomic force microscopy | — | 2017-06-27 |
| 9678103 | Automatic tuning of atomic force microscope | Daniel Y. Abramovitch | 2017-06-13 |
| 9391590 | Cascaded digital filters with reduced latency | Daniel Y. Abramovitch | 2016-07-12 |
| 9229027 | Atomic force microscopy controller and method | — | 2016-01-05 |
| 8769710 | Atomic force microscope system using selective active damping | Richard K. Workman | 2014-07-01 |
| 8370961 | Providing a topographic signal of sample using atomic force microscope | Daniel Y. Abramovitch | 2013-02-05 |