DA

Daniel Y. Abramovitch

AT Agilent Technologies: 12 patents #128 of 3,411Top 4%
HP HP: 9 patents #2,518 of 16,619Top 20%
KT Keysight Technologies: 2 patents #116 of 567Top 25%
AP Avago Technologies General Ip Pte.: 1 patents #18 of 125Top 15%
SP Sensor Platforms: 1 patents #10 of 14Top 75%
Overall (All Time): #145,059 of 4,157,543Top 4%
27
Patents All Time

Issued Patents All Time

Showing 1–25 of 27 patents

Patent #TitleCo-InventorsDate
11244818 Method for finding species peaks in mass spectrometry 2022-02-08
9678103 Automatic tuning of atomic force microscope Christopher Ryan Moon 2017-06-13
9391590 Cascaded digital filters with reduced latency Christopher Ryan Moon 2016-07-12
RE45292 Re-writable optical disk having reference clock information permanently formed on the disk David K. Towner 2014-12-16
8370961 Providing a topographic signal of sample using atomic force microscope Christopher Ryan Moon 2013-02-05
RE43788 Re-writable optical disk having reference clock information permanently formed on the disk David K. Towner 2012-11-06
8074291 Harmonic correcting controller for a scanning probe microscope 2011-12-06
7987006 Automatic generation of PID parameters for a scanning probe microscope Storrs T. Hoen, Richard K. Workman 2011-07-26
7843627 Coherent demodulation with reduced latency adapted for use in scanning probe microscopes 2010-11-30
RE41881 Re-writable optical disk having reference clock information permanently formed on the disk David K. Towner 2010-10-26
7768738 Mitigating the effects of disturbances of a disk drive George Hsu 2010-08-03
7701836 Re-writable optical disk having reference clock information permanently formed on the disk David K. Towner 2010-04-20
7683567 Method for improving scanning probe microscope imaging by inverse filtering 2010-03-23
7607343 System for nano position sensing in scanning probe microscopes using an estimator 2009-10-27
7472585 Method for rapid seeks to the measurement surface for a scanning probe microscope 2009-01-06
7401502 Nano position sensing and surface estimation in scanning probe microscopes using reference estimation 2008-07-22
7321840 Apparatus for monitoring tire pressure 2008-01-22
6973599 Method of and system for constructing valid data for memory-based tests 2005-12-06
6961317 Identifying and synchronizing permuted channels in a parallel channel bit error rate tester Michael Weinstein, Heinz R. Plitschka 2005-11-01
6928036 Harmonic correction in phase-locked loops Michael Fischer, Joshua Noel Hogan, Carl Taussig 2005-08-09
6745148 Intelligent test point selection for bit error rate tester-based diagrams 2004-06-01
6646964 Harmonic correction in phase-locked loops Michael Fischer, Joshua Noel Hogan, Carl Taussig 2003-11-11
6393596 Missing pulse detector using synchronous detection Michael Fischer, Josh Hogan, Terril N. Hurst, Carl Taussig 2002-05-21
6046968 Re-writable optical disk having reference clock information permanently formed on the disk David K. Towner 2000-04-04
5909661 Method and apparatus for decomposing drive error signal noise sources Terril N. Hurst, Richard H. Henze 1999-06-01