YF

Yasuo Furukawa

AD Advantest: 41 patents #6 of 1,193Top 1%
Fujitsu Limited: 3 patents #8,614 of 24,456Top 40%
HH Hirakawa Hewtech: 2 patents #2 of 16Top 15%
TT The University Of Tokyo: 2 patents #500 of 2,633Top 20%
TK Takeda Riken Kogyo Kabushikikaisha: 1 patents #24 of 49Top 50%
TC Toho Rayon Co.: 1 patents #21 of 61Top 35%
UN Unknown: 1 patents #29,356 of 83,584Top 40%
KC Kokusai Denshin Denwa Co.: 1 patents #219 of 382Top 60%
NE Nec: 1 patents #7,889 of 14,502Top 55%
SC Shin-Etsu Chemical Co.: 1 patents #1,340 of 2,176Top 65%
📍 Tokyo, CA: #168 of 583 inventorsTop 30%
Overall (All Time): #56,606 of 4,157,543Top 2%
49
Patents All Time

Issued Patents All Time

Showing 26–49 of 49 patents

Patent #TitleCo-InventorsDate
7327156 LSI testing apparatus for testing an electronic device Masahiro Ichinomiya, Masaki Hashidume, Takeomi Tamesada 2008-02-05
7301359 Testing apparatus, and testing method 2007-11-27
7298162 Test apparatus and test method 2007-11-20
7242197 Current measuring apparatus, test apparatus, and coaxial cable and assembled cable for the apparatuses Mitsunori Satou 2007-07-10
7126367 Test apparatus, test method, electronic device, and electronic device manufacturing method 2006-10-24
7075326 LSI testing apparatus Masahiro Ichinomiya, Masaki Hashidume, Takeomi Tamesada 2006-07-11
7071721 Device and method for electronic device test 2006-07-04
7023233 Test apparatus and test method 2006-04-04
6992497 LSI testing apparatus for testing an electronic device Masahiro Ichinomiya, Masaki Hashidume, Takeomi Tamesada 2006-01-31
6894301 Method and apparatus for testing circuit using light emission 2005-05-17
6795496 Jitter measuring device and method Mani Soma, Takahiro Yamaguchi, Masahiro Ishida, Toshifumi Watanabe 2004-09-21
6687868 Test device and method for electrically testing electronic device Koji Asami 2004-02-03
6687629 Apparatus for and method of measuring a jitter Takahiro Yamaguchi, Mani Soma, Masahiro Ishida, Toshifumi Watanabe 2004-02-03
6654916 Waveform generator, semiconductor testing device and semiconductor device 2003-11-25
6498998 Method and apparatus for testing a semiconductor device 2002-12-24
6404371 Waveform generator and testing device Takeshi Takahashi, Masayuki Kawabata 2002-06-11
5284702 Low fuming phenolic resin prepreg and process for producing the same Yoshitaka Umemoto, Takayuki Tanaka 1994-02-08
5113139 Low-distortion waveform generating method and waveform generator using the same 1992-05-12
4797931 Audio frequency signal identification apparatus Katsuyuki Yamazaki, Takemi Hosaka, Akira Fukui 1989-01-10
4719645 Rotary anode assembly for an X-ray source Masaki Yamabe, Yoshitaka Kitamura, Toshihiko Osada 1988-01-12
4637027 Laser light source device Masataka Shirasaki, Hirochika Nakajima, Takefumi Inagaki 1987-01-13
4612354 Method for preventing polymer scale deposition in the polymerization of a vinylic monomer Toshihide Shimizu, Ichiro Kaneko 1986-09-16
4484077 Exposure system and method using an electron beam Seigo Igaki, Yoshiro Goto 1984-11-20
4459580 DA Converter 1984-07-10