Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7327156 | LSI testing apparatus for testing an electronic device | Yasuo Furukawa, Masahiro Ichinomiya, Takeomi Tamesada | 2008-02-05 |
| 7075326 | LSI testing apparatus | Yasuo Furukawa, Masahiro Ichinomiya, Takeomi Tamesada | 2006-07-11 |
| 6992497 | LSI testing apparatus for testing an electronic device | Yasuo Furukawa, Masahiro Ichinomiya, Takeomi Tamesada | 2006-01-31 |