Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12189306 | Method and system of surface topography measurement for lithography | Yung-Yao Lee, Yang-Ann Chu, Yung-Hsiang Chen, Yung-Cheng Chen | 2025-01-07 |
YW
Yeh-Chin Wang
Overall (2025): #164,611 of 469,880Top 40%
1
Patents 2025