Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12360151 | Method of testing, wafer, and testing station | Mohamad Dernaika, Ludovic Caro, Alison Perrott, Frank Peters | 2025-07-15 |
| 12233639 | Source wafer, method, and optoelectronic devices | Mohamad Dernaika, Frank Peters, Guomin Yu | 2025-02-25 |