Issued Patents 2025
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12360151 | Method of testing, wafer, and testing station | Mohamad Dernaika, Ludovic Caro, Alison Perrott, Hua Yang | 2025-07-15 |
| 12313878 | Optoelectronic device and method of manufacture thereof | Aaron John Zilkie, Henri Nykänen, Charles Tsai, Guomin Yu | 2025-05-27 |
| 12233639 | Source wafer, method, and optoelectronic devices | Hua Yang, Mohamad Dernaika, Guomin Yu | 2025-02-25 |
| 12197050 | Integrated III-V / silicon optoelectronic device and method of manufacture thereof | Guomin Yu, Aaron John Zilkie | 2025-01-14 |