AP

Alison Perrott

RL Rockley Photonics Limited: 1 patents #20 of 40Top 50%
Overall (2025): #459,175 of 469,880Top 100%
1
Patents 2025

Issued Patents 2025

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
12360151 Method of testing, wafer, and testing station Mohamad Dernaika, Ludovic Caro, Hua Yang, Frank Peters 2025-07-15