Partial year: Data through Q3 2025 (Sept 30). Full-year totals not yet available.
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Chan-Hong Chern

TSMC: 16 patents #114 of 3,957Top 3%
📍 Palo Alto, CA: #16 of 1,602 inventorsTop 1%
🗺 California: #380 of 55,090 inventorsTop 1%
Overall (2025): #2,463 of 469,880Top 1%
16
Patents 2025

Issued Patents 2025

Showing 1–16 of 16 patents

Patent #TitleCo-InventorsDate
12432959 Gallium nitride-on-silicon devices Jun-De Jin 2025-09-30
12411366 Waveguide structure 2025-09-09
12405422 Cladding structure for semiconductor waveguide 2025-09-02
12407343 Semiconductor devices and circuits with increased breakdown voltage Yi-An Lai, Cheng-Hsiang Hsieh 2025-09-02
12400918 Quality detection method and apparatus Yi-An Lai, Chih-Hua Wang, Cheng-Hsiang Hsieh 2025-08-26
12368139 Structures for providing electrical isolation in semiconductor devices Mark Chen 2025-07-22
12355024 Heterogenous integration scheme for III-V/Si and Si CMOS integrated circuits Yi-An Lai 2025-07-08
12334925 Pulse width control apparatus and method Yi-An Lai, Cheng-Hsiang Hsieh 2025-06-17
12317587 Apparatus and circuits including transistors with different threshold voltages and methods of fabricating the same 2025-05-27
12298565 Optical device for coupling light and method for fabricating the same Chih-Chang Lin, Chewn-Pu Jou, Chih-Tsung Shih, Feng-Wei Kuo, Lan-Chou Cho +2 more 2025-05-13
12276836 Optical waveguide apparatus and method of fabrication thereof Chih-Chang Lin, Min-Hsiang Hsu, Weiwei Song, Chewn-Pu Jou, Feng-Wei Kuo +2 more 2025-04-15
12272744 Apparatus and circuits including transistors with different polarizations and methods of fabricating the same 2025-04-08
12253745 Silicon photonic device with backup light paths Weiwei Song, Stefan Rusu, Chih-Chang Lin 2025-03-18
12230636 Apparatus and circuits with dual threshold voltage transistors and methods of fabricating the same 2025-02-18
12228768 Fabrication process control in optical devices Weiwei Song, Chih-Chang Lin, Stefan Rusu, Min-Hsiang Hsu 2025-02-18
12216152 Gallium nitride-based devices and methods of testing thereof Yi-An Lai, Cheng-Hsiang Hsieh 2025-02-04