Issued Patents 2025
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12385946 | Method of inspecting tip of atomic force microscope and method of manufacturing semiconductor device | Kwangeun Kim, Seungbum Hong, Sungyoon Ryu, Hoon Kim, Jiwon Yeom +3 more | 2025-08-12 |
| 12362138 | Method of operating scanning electron microscope (SEM) and method of manufacturing semiconductor device using the same | Jaehyung Ahn, Kwangeun Kim, Souk Kim | 2025-07-15 |
| 12332164 | Dual resolution spectrometer, and spectrometric measurement apparatus and method using the spectrometer | Sunhong Jun, Jaeho Kim | 2025-06-17 |
| 12332186 | Method and system for inspecting semiconductor wafer and method of fabricating semiconductor device using the same | Q-Han Park, Sung Yoon Ryu, Seunghyeok Son, Sujin Lee, Chan-Gi Jeon +2 more | 2025-06-17 |