Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12385946 | Method of inspecting tip of atomic force microscope and method of manufacturing semiconductor device | Kwangeun Kim, Sungyoon Ryu, Hoon Kim, Jiwon Yeom, Seokjung Yun +3 more | 2025-08-12 |