Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12385946 | Method of inspecting tip of atomic force microscope and method of manufacturing semiconductor device | Seungbum Hong, Sungyoon Ryu, Hoon Kim, Jiwon Yeom, Seokjung Yun +3 more | 2025-08-12 |
| 12362138 | Method of operating scanning electron microscope (SEM) and method of manufacturing semiconductor device using the same | Jaehyung Ahn, Souk Kim, Younghoon Sohn | 2025-07-15 |