Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12423779 | Metrology system utilizing points-from-focus type processes with glare reduction | — | 2025-09-23 |
| 12204226 | Metrology system configured to illuminate and measure apertures of workpieces | Paul Gerard Gladnick, Christopher Richard Hamner | 2025-01-21 |