Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12242047 | Metrology system utilizing annular optical configuration | — | 2025-03-04 |
| 12204226 | Metrology system configured to illuminate and measure apertures of workpieces | Christopher Richard Hamner, Pavel Ivanovich Nagornykh | 2025-01-21 |