Issued Patents 2025
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12352704 | Metrology system for measuring edge of circular workpiece | Vahan Senekerimyan | 2025-07-08 |
| 12320635 | Measuring probe with field generating coil configuration and temperature compensation | Scott Allen Harsila | 2025-06-03 |
| 12204226 | Metrology system configured to illuminate and measure apertures of workpieces | Paul Gerard Gladnick, Pavel Ivanovich Nagornykh | 2025-01-21 |