Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12373936 | System and method for overlay metrology using a phase mask | Itay Gdor, Yuval Lubashevsky, Yaniv Weiss, Nireekshan K. Reddy | 2025-07-29 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12373936 | System and method for overlay metrology using a phase mask | Itay Gdor, Yuval Lubashevsky, Yaniv Weiss, Nireekshan K. Reddy | 2025-07-29 |