Issued Patents 2025
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12347718 | Wafer conveyance unit and wafer conveyance method | Toshimichi Ishizuka, Masataka IKESU | 2025-07-01 |
| 12340504 | Semiconductor inspecting method and semiconductor inspecting device | Xiangguang Mao, Akihito Uchikado | 2025-06-24 |
| 12222387 | Semiconductor device inspection method and semiconductor device inspection apparatus | Norimichi Chinone, Tomonori Nakamura, Shigeru Eura | 2025-02-11 |