Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12222387 | Semiconductor device inspection method and semiconductor device inspection apparatus | Norimichi Chinone, Tomonori Nakamura, Akira Shimase | 2025-02-11 |
| 12209996 | Ultrasonic testing device and ultrasonic testing method | Naohiro Hozumi, Takuto Matsui, Toru Matsumoto | 2025-01-28 |