Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12340504 | Semiconductor inspecting method and semiconductor inspecting device | Akira Shimase, Xiangguang Mao | 2025-06-24 |
| 12320842 | Inspection device for a semiconductor device | Tomonori Nakamura, Mitsunori Nishizawa | 2025-06-03 |