Issued Patents 2025
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12406891 | Characterization of asymmetric material deposition for metrology | — | 2025-09-02 |
| 12324237 | Diffusion-break region in stacked-FET integrated circuit device | Ruilong Xie, Alexander Reznicek, Tsung-Sheng Kang | 2025-06-03 |
| 12262552 | Source/drain epitaxy process in stacked FET | Tsung-Sheng Kang, Alexander Reznicek, Ruilong Xie | 2025-03-25 |