Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12320757 | Semiconductor inspection tool system and method for wafer edge inspection | Carmel Yehuda Drillman, Moshe Edri, Menachem Regensburger, Baheej Bathish | 2025-06-03 |
| 12315206 | Inspection system for edge and bevel inspection of semiconductor structures | Carmel Yehuda Drillman, Moshe Edri, Ohad Shimon, Shimon Koren, Gil Perlberg | 2025-05-27 |