Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12320757 | Semiconductor inspection tool system and method for wafer edge inspection | Carmel Yehuda Drillman, Moshe Edri, Baheej Bathish, Mordi Dahan | 2025-06-03 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12320757 | Semiconductor inspection tool system and method for wafer edge inspection | Carmel Yehuda Drillman, Moshe Edri, Baheej Bathish, Mordi Dahan | 2025-06-03 |