Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12315206 | Inspection system for edge and bevel inspection of semiconductor structures | Carmel Yehuda Drillman, Mordi Dahan, Moshe Edri, Ohad Shimon, Gil Perlberg | 2025-05-27 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12315206 | Inspection system for edge and bevel inspection of semiconductor structures | Carmel Yehuda Drillman, Mordi Dahan, Moshe Edri, Ohad Shimon, Gil Perlberg | 2025-05-27 |