Issued Patents 2025
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12429328 | Metrology method, target and substrate | Kaustuve Bhattacharyya, Henricus Wilhelmus Maria Van Buel, Christophe David Fouquet, Hendrik Jan Hidde Smilde, Maurits Van Der Schaar +7 more | 2025-09-30 |
| 12287584 | Methods and apparatus for obtaining diagnostic information relating to an industrial process | Alexander Ypma, Jasper Menger, David Deckers, David Han, Adrianus Cornelis Matheus Koopman +3 more | 2025-04-29 |
| 12254392 | Apparatus and method for property joint interpolation and prediction | Faegheh Hasibi, Leon Paul VAN DIJK, Maialen LARRANAGA, Alexander Ypma | 2025-03-18 |
| 12189308 | Method for adjusting a target feature in a model of a patterning process based on local electric fields | Leon Paul VAN DIJK, Oktay Yildirim, Orion Jonathan Pierre Mouraille | 2025-01-07 |