HL

Hui Quan LIM

AB Asml Netherlands B.V.: 1 patents #169 of 589Top 30%
Overall (2025): #364,402 of 469,880Top 80%
1
Patents 2025

Issued Patents 2025

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
12276921 Substrate comprising a target arrangement, and associated at least one patterning device, lithographic method and metrology method Olger Victor Zwier, Maurits Van Der Schaar, Hilko Dirk Bos, Hans Van Der Laan, S. M. Masudur Rahman Al Arif +6 more 2025-04-15