Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12163995 | GaN reliability built-in self test (BIST) apparatus and method for qualifying dynamic on-state resistance degradation | Yu-Ann LAI, Ruo-Rung HUANG, Kun-Lung Chen, Chan-Hong Chern | 2024-12-10 |
| 12002774 | Passivation scheme for pad openings and trenches | Ming-Hong Chang, Kun-Ming Huang, Po-Tao Chu, Shen-Ping Wang, Chien-Li Kuo | 2024-06-04 |