Issued Patents 2024
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12163995 | GaN reliability built-in self test (BIST) apparatus and method for qualifying dynamic on-state resistance degradation | Yu-Ann LAI, Kun-Lung Chen, Chun-Yi Yang, Chan-Hong Chern | 2024-12-10 |