JT

Jiuzhou Tang

SY Synopsys: 1 patents #48 of 291Top 20%
Overall (2024): #414,208 of 561,600Top 75%
1
Patents 2024

Issued Patents 2024

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
11914306 Predicting defect rate based on lithographic model parameters Erik Verduijn, Ulrich Klostermann, Ulrich Welling, Hans-Jürgen Stock 2024-02-27