EV

Erik Verduijn

SY Synopsys: 1 patents #48 of 291Top 20%
📍 Rensselaer, NY: #5 of 11 inventorsTop 50%
🗺 New York: #4,046 of 12,119 inventorsTop 35%
Overall (2024): #472,836 of 561,600Top 85%
1
Patents 2024

Issued Patents 2024

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
11914306 Predicting defect rate based on lithographic model parameters Ulrich Klostermann, Ulrich Welling, Jiuzhou Tang, Hans-Jürgen Stock 2024-02-27