Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12130242 | Inspection system of semiconductor wafer and method of driving the same | Doyoung Yoon, Jeongho Ahn, Dongryul Lee, Dongchul Ihm | 2024-10-29 |
| 11988495 | Through-focus image-based metrology device, operation method thereof, and computing device for executing the operation | Kwangsoo Kim, Sungyoon Ryu, Daejun Park, Seong Jin YUN, Seungryeol Oh +4 more | 2024-05-21 |