Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12175655 | Substrate inspection method and device | Junghoon Kim, Ilsuk Park, Kwangil Shin | 2024-12-24 |
| 12130242 | Inspection system of semiconductor wafer and method of driving the same | Jeongho Ahn, Dongryul Lee, Dongchul Ihm, Chungsam Jun | 2024-10-29 |