| 12131795 |
Adaptive temperature compensation for a memory device |
Vamsi Pavan Rayaprolu |
2024-10-29 |
| 12119068 |
Program continuation strategies after memory device power loss |
Gary F. Besinga, Vamsi Pavan Rayaprolu, Renato C. Padilla |
2024-10-15 |
| 12073866 |
Two-stage voltage calibration upon power-up of memory device |
Chia-Yu Kuo |
2024-08-27 |
| 12057190 |
Determining read voltage offset in memory devices |
Robert W. Mason, Pitamber Shukla |
2024-08-06 |
| 12040025 |
Two-sided page scans with calibration feedback |
Christopher M. Smitchger, Vamsi Pavan Rayaprolu, Patrick R. Khayat, Hyung Seok Kim |
2024-07-16 |
| 11977774 |
Charge loss mitigation throughout memory device lifecycle by proactive window shift |
Ugo Russo, Vamsi Pavan Rayaprolu |
2024-05-07 |
| 11955194 |
Tracking and refreshing state metrics in memory sub-systems |
Michael Sheperek, Bruce A. Liikanen |
2024-04-09 |
| 11922041 |
Threshold voltage bin calibration at memory device power up |
Chia-Yu Kuo |
2024-03-05 |
| 11914890 |
Trim value loading management in a memory sub-system |
Vamsi Pavan Rayaprolu |
2024-02-27 |
| 11886726 |
Block family-based error avoidance for memory devices |
Michael Sheperek, Kishore Kumar Muchherla, Mustafa N. Kaynak, Vamsi Pavan Rayaprolu, Bruce A. Liikanen +3 more |
2024-01-30 |
| 11886712 |
Die family management on a memory device using block family error avoidance |
— |
2024-01-30 |
| 11862274 |
Determination of state metrics of memory sub-systems following power events |
Michael Sheperek, Bruce A. Liikanen |
2024-01-02 |
