Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11861824 | Reference image grouping in overlay metrology | Einat Peled, Naama Cohen | 2024-01-02 |
| 11862522 | Accuracy improvements in optical metrology | Barak Bringoltz, Evgeni Gurevich, Ido Adam, Yoel Feler, Dror Alumot +6 more | 2024-01-02 |