Issued Patents 2024
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12038271 | Detecting outliers and anomalies for OCD metrology machine learning | EITAN ROTHSTEIN, Yongha Kim, Ilya Rubinovich, ARIEL BROITMAN, OLGA KRASNYKOV | 2024-07-16 |
| 11874606 | System and method for controlling measurements of sample's parameters | Ofer SHLAGMAN, Ran YACOBY, Noam Tal | 2024-01-16 |
| 11862522 | Accuracy improvements in optical metrology | Evgeni Gurevich, Ido Adam, Yoel Feler, Dror Alumot, Yuval Lamhot +6 more | 2024-01-02 |