Issued Patents 2024
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12164277 | System and method for mitigating overlay distortion patterns caused by a wafer bonding tool | Franz Zach, Roel Gronheid | 2024-12-10 |
| 12117347 | Metrology target design for tilted device designs | Myungjun Lee, Michael Adel, Eran Amit, Daniel Kandel | 2024-10-15 |