LK

Leonid Karlinsky

Applied Materials: 1 patents #861 of 1,809Top 50%
IBM: 1 patents #1,883 of 5,109Top 40%
Overall (2024): #142,930 of 561,600Top 30%
2
Patents 2024

Issued Patents 2024

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
12183066 Method of deep learning-based examination of a semiconductor specimen and system thereof Boaz Cohen, Idan Kaizerman, Efrat Rosenman, Amit Batikoff, Daniel Ravid +1 more 2024-12-31
11954144 Training visual language grounding models using separation loss Assaf ARBELLE, Sivan Doveh, Joseph Shtok, Amit Alfassy 2024-04-09