Issued Patents 2024
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12183066 | Method of deep learning-based examination of a semiconductor specimen and system thereof | Leonid Karlinsky, Boaz Cohen, Efrat Rosenman, Amit Batikoff, Daniel Ravid +1 more | 2024-12-31 |