Issued Patents 2024
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12183066 | Method of deep learning-based examination of a semiconductor specimen and system thereof | Leonid Karlinsky, Idan Kaizerman, Efrat Rosenman, Amit Batikoff, Daniel Ravid +1 more | 2024-12-31 |
| 11983867 | Mask inspection of a semiconductor specimen | Ariel Shkalim, Vladimir OVECHKIN, Evgeny Bal, Ronen Madmon, Ori Petel +2 more | 2024-05-14 |
| 11940390 | Selecting a representative subset of potential defects to improve defect classifier training and estimation of expected defects of interest | Yotam Sofer, Shaul Engler, Saar Shabtay, Amir Bar, Marcelo BACHER | 2024-03-26 |